The Horiba Jobin Yvon LabRAM HR system provides ultra high spectroscopic resolution and a unique wavelength range capability that provides both great flexibility and high performance.

It is a an integrated, simple to use, and high stability bench-top instrument designed to undertake reproducible Raman measurements at high, medium or even low spectral resolution. The high resolution mode is uniquely ideal for subtle band analysis such as that for phase (crystalline/amorphous), of proteins, hydrogen and weak bonding forces and semiconductor stress measurements in fact most applications where it is important for the precise characterization of position or shape of the Raman spectral features. Band analysis in the order of 0.3 cm^-1 to 1 cm^-1 is particularly suited to the HR mode. Its dual capabilities also enable more routine Raman analysis and even broader band laser induced micro-fluorescence or luminescence to be conducted all upon the same bench-top instrument.

The LabRAM HR high resolution system offers unparalleled flexibility and performance :

• Unique high, medium and low resolution multichannel spectral modes.
• Suitable for Raman, fluorescence and luminescence measurements.
• True confocality - maximum spatial resolution and better defined images.
• Multiple laser capability, from visible to near IR (extended NIR and UV versions).
• Ultimate stability.
• Large 1024 pixel CCD chip dimensions - various chip formats are available.
• Unique adjustable angle notch filter technology.
• Automated software operation including external cooling stages.
• Fast Map imaging modes.

High Resolution

The 800 mm focal length spectrometer of the LabRAM HR gives a resolution approximately 3 times higher than that of more standard bench-top instruments (eg. 300 mm focal length) and even higher than that for older types of instruments (eg. 250 mm focal length). It can be clearly seen in the figure (below) that the number of data points covering a typical Raman band in the high resolution system enables subtle Raman band shifts to be analyzed far more accurately than data collected on one of the smaller systems. Similarly the Raman band shape is far better resolved with the HR system which in itself is another important factor as not only position but also shape can characterize important sample changes.
LabRAM HR - provides far better characterization of band position and shape.

Unique Flexibility

The further unique addition for the LabRAM HR is the ability to add additional exit ports onto the system. Thus with a dual port option, the possibility of adding an IR InGaAs array, ICCD, PMT or other specialized single channel detectors is a reality for future expansion. In essence, such a system then can have broad laser source suitability and multiple detection options, offering extended spectral ranges or analysis into the time domain.

The option for near-IR detection for instance is particularly useful for luminescence measurements (eg. for semiconductor materials) and for Raman analysis with either 830 nm or 1064 nm excitation. Both measurements will have spectral components beyond the detection range of the standard silicon based CCD detector - for instance, with many important semiconductor III-V materials important information is found in the 1100 nm, and 1300 nm regions - not sensibly detectable with a silicon device. Moving to other detectors (for example, InGaAs or Ge) these regions can be detected with ease.

Stress Induced Raman Shifts

The LabRAM HR is an ideal tool for stress measurement. The Raman Analysis of stressed Silicon in the solid phase shows the identification of shifts in the Raman spectral features in the order of 0.3 cm^-1.

New SOI and SiGe films in semiconductor devices exhibit similarly small band position and shape modifications, measurements ideally suited to the LabRAM HR.